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[IEEE 2011 IEEE Pulsed Power Conference (PPC) - Chicago, IL, USA (2011.06.19-2011.06.23)] 2011 IEEE Pulsed Power Conference - Analysis of SiC JFET devices during pulsed operation

✍ Scribed by Lawson, K.; Alvarez, G.; Bayne, S.; Veliadis, V.; Urciuoli, D.

No coin nor oath required. For personal study only.

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