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[IEEE 2011 IEEE International Vacuum Electronics Conference (IVEC) - Bangalore, Karnataka, India (2011.02.21-2011.02.24)] 2011 IEEE International Vacuum Electronics Conference (IVEC) - M-type cathode life tests

✍ Scribed by Cheng, Cheng; Li, Ji; Yu, Zhiqiang; Wang, Hui

Book ID: 117993799
Publisher: IEEE
Year: 2011
Weight: 104 KB
Volume: 0
Category: Article
ISBN: 1424486629
DOI: 10.1109/ivec.2011.5747027

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