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[IEEE 2011 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2011.02.20-2011.02.24)] 2011 IEEE International Solid-State Circuits Conference - EP2: 20–22nm technology options and design implications

✍ Scribed by Draper, Don

Book ID: 118177220
Publisher: IEEE
Year: 2011
Weight: 832 KB
Volume: 0
Category: Article
ISBN: 1612843034
DOI: 10.1109/isscc.2011.5746420

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