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[IEEE 2011 IEEE International Joint Conference on Biometrics (IJCB) - Washington, DC, USA (2011.10.11-2011.10.13)] 2011 International Joint Conference on Biometrics (IJCB) - A framework for quality-based biometric classifier selection

✍ Scribed by Bhatt, Himanshu S.; Bharadwaj, Samarth; Vatsa, Mayank; Singh, Richa; Ross, Arun; Noore, Afzel

Book ID: 118021789
Publisher: IEEE
Year: 2011
Weight: 1018 KB
Volume: 0
Category: Article
ISBN: 1457713578
DOI: 10.1109/ijcb.2011.6117518

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