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[IEEE 2011 IEEE International Conference on Quality and Reliability (ICQR) - Bangkok, Thailand (2011.09.14-2011.09.17)] 2011 IEEE International Conference on Quality and Reliability - Software reliability growth models based on Marshall-Olkin generalized exponential families of distributions

✍ Scribed by Gopal, G.; Damodaran, D.

Book ID: 126220706
Publisher: IEEE
Year: 2011
Weight: 546 KB
Category: Article
ISBN: 1457706261
DOI: 10.1109/ICQR.2011.6031704

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