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[IEEE 2011 IEEE International Conference on Quality and Reliability (ICQR) - Bangkok, Thailand (2011.09.14-2011.09.17)] 2011 IEEE International Conference on Quality and Reliability - An integrated approach for risk-assessment analysis in a manufacturing process using FMEA and DES

✍ Scribed by Neghab, A. Pirayesh; Siadat, A.; Tavakkoli-Moghaddam, R.; Jolai, F.

Book ID: 111864563
Publisher: IEEE
Year: 2011
Weight: 929 KB
Volume: 0
Category: Article
ISBN: 1457706261
DOI: 10.1109/icqr.2011.6031743

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