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[IEEE 2011 IEEE International Conference on Imaging Systems and Techniques (IST) - Batu Ferringhi, Malaysia (2011.05.17-2011.05.18)] 2011 IEEE International Conference on Imaging Systems and Techniques - DC bias compensation in digital AC-based capacitance measurement for ECT

✍ Scribed by Zhou, Haili; Xu, Lijun; Cao, Zhang; Hu, Jinhai; Liu, Xingbin

Book ID: 126705276
Publisher: IEEE
Year: 2011
Weight: 328 KB
Category: Article
ISBN: 161284894X
DOI: 10.1109/IST.2011.5962194

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