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[IEEE 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 - San Jose, CA (2011.09.19-2011.09.21)] 2011 IEEE Custom Integrated Circuits Conference (CICC) - A 5-GS/s 4-bit flash ADC with triode-load bias voltage trimming offset calibration in 65-nm CMOS

✍ Scribed by Yao, Junjie; Liu, Jin

Book ID: 121221664
Publisher: IEEE
Year: 2011
Weight: 574 KB
Category: Article
ISBN: 1457702215
DOI: 10.1109/CICC.2011.6188616

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