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[IEEE 2011 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2011) - Cancun, Mexico (2011.10.16-2011.10.19)] 2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Study on voltage maintaining performance of metalized film capacitors under high electric fields

✍ Scribed by Li, Hua; Chen, Yaohong; Lin, Fuchang; Lv, Fei; Li, Zhiwei; Zhang, Miao

Book ID: 120796757
Publisher: IEEE
Year: 2011
Weight: 476 KB
Category: Article
ISBN: 1457709848
DOI: 10.1109/CEIDP.2011.6232752

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