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[IEEE 2011 IEEE Applied Electromagnetics Conference (AEMC) - Kolkata, India (2011.12.18-2011.12.22)] 2011 IEEE Applied Electromagnetics Conference (AEMC) - Study of resolution in microwave imaging using Linear Sampling Method

✍ Scribed by Mallikarjun, E.; Bhattacharya, Amitabha

Book ID: 118003747
Publisher: IEEE
Year: 2011
Weight: 568 KB
Category: Article
ISBN: 1457710978
DOI: 10.1109/aemc.2011.6256856

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