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[IEEE 2011 IEEE 9th International Conference on ASIC (ASICON 2011) - Xiamen, China (2011.10.25-2011.10.28)] 2011 9th IEEE International Conference on ASIC - Single event upset immune latch circuit design using C-element

✍ Scribed by Rajaei, Ramin; Tabandeh, Mahmoud; Rashidian, Bizhan

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