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[IEEE 2011 IEEE 57th Holm Conference on Electrical Contacts (Holm 2011) - Minneapolis, MN, USA (2011.09.11-2011.09.14)] 2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) - Arc Fault Model of Conductance. Application to the UL1699 Tests Modeling

✍ Scribed by Andrea, Jonathan; Schweitzer, Patrick; Martel, Jean-Mary

Book ID: 120293146
Publisher: IEEE
Year: 2011
Weight: 545 KB
Category: Article
ISBN: 1612846505
DOI: 10.1109/HOLM.2011.6034778

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