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[IEEE 2011 IEEE 43rd Southeastern Symposium on System Theory (SSST 2011) - Auburn, AL, USA (2011.03.14-2011.03.16)] 2011 IEEE 43rd Southeastern Symposium on System Theory - A DSP-based ramp test for on-chip high-resolution ADC

✍ Scribed by Jiang, Wei; Agrawal, Vishwani D.

Book ID: 120593045
Publisher: IEEE
Year: 2011
Weight: 343 KB
Category: Article
ISBN: 1424495946
DOI: 10.1109/SSST.2011.5753807

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