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[IEEE 2011 IEEE 24th International Conference on Micro Electro Mechanical Systems (MEMS) - Cancun, Mexico (2011.01.23-2011.01.27)] 2011 IEEE 24th International Conference on Micro Electro Mechanical Systems - Fabrication of sharp tips with high aspect ratio by surfactant-modified wet etching for the AFM probe

โœ Scribed by Tang, B.; Sato, K.; Tanaka, H.; Gosalvez, M. A.


Book ID
121294101
Publisher
IEEE
Year
2011
Weight
887 KB
Category
Article
ISBN
1424496322

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