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[IEEE 2011 IEEE 22nd International Symposium on Software Reliability Engineering (ISSRE) - Hiroshima, Japan (2011.11.29-2011.12.2)] 2011 IEEE 22nd International Symposium on Software Reliability Engineering - PACOGEN: Automatic Generation of Pairwise Test Configurations from Feature Models

โœ Scribed by Hervieu, Aymeric; Baudry, Benoit; Gotlieb, Arnaud


Book ID
127047239
Publisher
IEEE
Year
2011
Weight
331 KB
Category
Article
ISBN
0769545688

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