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[IEEE 2011 IEEE 17th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Timisoara, Romania (2011.10.20-2011.10.23)] 2011 IEEE 17th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Accelerated ageing tests for predicting capacitor lifetimes

✍ Scribed by Jano, Rajmond; Pitica, Dan

Book ID: 120089710
Publisher: IEEE
Year: 2011
Weight: 971 KB
Category: Article
ISBN: 145771275X
DOI: 10.1109/SIITME.2011.6102687

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