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[IEEE 2011 Fourth International Symposium on Knowledge Acquisition and Modeling (KAM) - Sanya, TBD, China (2011.10.8-2011.10.9)] 2011 Fourth International Symposium on Knowledge Acquisition and Modeling - Competitive Technical Intelligence Analysis Based on Patents Coupling

✍ Scribed by Taotao, Sun; Yun, Liu; Wenping, Wang

Book ID: 118044767
Publisher: IEEE
Year: 2011
Weight: 188 KB
Volume: 0
Category: Article
ISBN: 1457717883
DOI: 10.1109/kam.2011.17

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