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[IEEE 2011 European Conference on Circuit Theory and Design (ECCTD) - Linkoping, Sweden (2011.08.29-2011.08.31)] 2011 20th European Conference on Circuit Theory and Design (ECCTD) - Production test of an RF receiver chain based on ATM combining RF BIST and machine learning algorithm

✍ Scribed by Darfeuille, Sebastien; Kelma, Christophe

Book ID: 115520664
Publisher: IEEE
Year: 2011
Weight: 513 KB
Volume: 0
Category: Article
ISBN: 1457706172
DOI: 10.1109/ecctd.2011.6043628

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