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[IEEE 2011 Electrical Insulation Conference (EIC) (Formerly EIC/EME) - Annapolis, MD, USA (2011.06.5-2011.06.8)] 2011 Electrical Insulation Conference (EIC). - Repetitive transient aging, the influence of rise time

✍ Scribed by Koltunowicz, Tomasz Lech; Kochetov, Roman; Bajracharya, Gautam; Djairam, Dhiradj; Smit, Johan J.

No coin nor oath required. For personal study only.

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