[IEEE 2011 Eighth International Conference on Information Technology: New Generations (ITNG) - Las Vegas, NV, USA (2011.04.11-2011.04.13)] 2011 Eighth International Conference on Information Technology: New Generations - A Model-Based Testing Using Scenarios and Constraints-based Modular Petri Nets

✍ Scribed by Reza, Hassan; Kerlin, Scott D.

• Book ID: 111891084
• Publisher: IEEE
• Year: 2011
• Weight: 256 KB
• Volume: 0
• Category: Article
• ISBN: 1612844278
• DOI: 10.1109/itng.2011.104