✦ LIBER ✦

[IEEE 2011 Design, Automation & Test in Europe - Grenoble (2011.03.14-2011.03.18)] 2011 Design, Automation & Test in Europe - Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)

✍ Scribed by Fazeli, M; Ahmadian, S N; Miremadi, S G; Asadi, H; Tahoori, M B

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