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[IEEE 2011 Academic International Symposium on Optoelectronics and Microelectronics Technology (AISOMT) - Harbin, China (2011.10.12-2011.10.16)] 2011 Academic International Symposium on Optoelectronics and Microelectronics Technology - A new low power test pattern generator based on two-bit twisted ring counter

✍ Scribed by Zhou, Bin; Wu, Qun; Xiao, Li-yi; Wu, Xin-chun; Cao, Bei

Book ID: 118260468
Publisher: IEEE
Year: 2011
Weight: 561 KB
Volume: 0
Category: Article
ISBN: 1457707950
DOI: 10.1109/aismot.2011.6159385

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