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[IEEE 2011 8th International Multi-Conference on Systems, Signals and Devices (SSD 2011) - Sousse (2011.03.22-2011.03.25)] Eighth International Multi-Conference on Systems, Signals & Devices - Fault parametric detection using flatness property of systems

✍ Scribed by Belgacem, A; Jerbi, H; Abdkerim, M N

Book ID: 121863475
Publisher: IEEE
Year: 2011
Weight: 168 KB
Category: Article
ISBN: 1457704137
DOI: 10.1109/SSD.2011.5767419

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