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[IEEE 2011 8th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE 2011) - Merida City, Mexico (2011.10.26-2011.10.28)] 2011 8th International Conference on Electrical Engineering, Computing Science and Automatic Control - Study of the properties of n+-type ZnO:Al films obtained from ZnO/Al/ZnO nanometric structure

โœ Scribed by Vasquez-A., M. A.; Andraca-Adame, J. A.; Romero-Paredes, G.; Pena-Sierra, R.


Book ID
118169255
Publisher
IEEE
Year
2011
Weight
321 KB
Volume
0
Category
Article
ISBN
1457710129

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