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[IEEE 2011 69th Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2011.06.20-2011.06.22)] 69th Device Research Conference - C-V measurements of single vertical nanowire capacitors

โœ Scribed by Mensch, P.; Moselund, K. E.; Karg, S.; Lortscher, E.; Bjork, M. T.; Schmid, H.; Riel, H.


Book ID
120981824
Publisher
IEEE
Year
2011
Weight
882 KB
Category
Article
ISBN
1612842437

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