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[IEEE 2011 5th Latin-American Symposium on Dependable Computing Workshops (LADC-W) - Sao Jose dos Campos, SP, Brazil (2011.04.25-2011.04.29)] 2011 Fifth Latin-American Symposium on Dependable Computing Workshops - A Model-Based Approach for Robustness Test Generation

✍ Scribed by Yano, Thaise; Martins, Eliane; de Sousa, Fabiano Luis

Book ID: 127244071
Publisher: IEEE
Year: 2011
Weight: 247 KB
Category: Article
ISBN: 1457701944
DOI: 10.1109/ladcw.2011.16

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