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[IEEE 2011 3rd International Workshop on Intelligent Systems and Applications (ISA) - Wuhan, China (2011.05.28-2011.05.29)] 2011 3rd International Workshop on Intelligent Systems and Applications - A Method for Analog Circuits Fault Diagnosis by Neural Network and Virtual Instruments

✍ Scribed by Li, Xiang; Zhang, Yang; Wang, Shujuan; Zhai, Guofu

Book ID: 118150913
Publisher: IEEE
Year: 2011
Weight: 514 KB
Volume: 0
Category: Article
ISBN: 1424498554
DOI: 10.1109/isa.2011.5873270

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