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[IEEE 2011 3rd International Conference on Electronics Computer Technology (ICECT) - Kanyakumari, India (2011.04.8-2011.04.10)] 2011 3rd International Conference on Electronics Computer Technology - Power analysis and diagnosis of faults in VLSI circuits

✍ Scribed by Prasad, B. K. V.; Madhu, T.; Kumar, P. Satish; Charles, B. S.; Ravi, S.

Book ID: 118055328
Publisher: IEEE
Year: 2011
Weight: 681 KB
Volume: 0
Category: Article
ISBN: 1424486785
DOI: 10.1109/icectech.2011.5941821

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