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[IEEE 2011 3rd International Conference on Electronics Computer Technology (ICECT) - Kanyakumari, India (2011.04.8-2011.04.10)] 2011 3rd International Conference on Electronics Computer Technology - 3D-TCAD simulation study of an electrically induced Source/drain cylindrically surrounding gate MOSFETs for reduced SCEs and HCEs

โœ Scribed by Gupta, Santosh Kumar; Baishya, Srimanta


Book ID
111937380
Publisher
IEEE
Year
2011
Weight
229 KB
Volume
0
Category
Article
ISBN
1424486785

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