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[IEEE 2011 24th International Conference on VLSI Design: concurrently with the 10th International Conference on Embedded Systems Design - Chennai (2011.01.2-2011.01.7)] 2011 24th Internatioal Conference on VLSI Design - Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation

✍ Scribed by Banerjee, A; Natarajan, V; Sen, S; Chatterjee, A; Srinivasan, G; Bhattacharya, S

Book ID: 120589893
Publisher: IEEE
Year: 2011
Weight: 426 KB
Category: Article
ISBN: 1612843271
DOI: 10.1109/VLSID.2011.65

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