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[IEEE 2011 23rd International Conference on Microelectronics (ICM) - Hammamet, Tunisia (2011.12.19-2011.12.22)] ICM 2011 Proceeding - A new efficient self-checking Hsiao SEC-DED memory error correcting code

✍ Scribed by Aymen, Fradi; Belgacem, Hamdi; Chiraz, Khedhiri

No coin nor oath required. For personal study only.

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