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[IEEE 2011 21st International Conference on Noise and Fluctuations (ICNF) - Toronto, ON, Canada (2011.06.12-2011.06.16)] 2011 21st International Conference on Noise and Fluctuations - 1/f noise in strained SiGe on Insulator MOSFETs

โœ Scribed by Valenza, M.; El Husseini, J.; Gyani, J.; Martinez, F.; Le Royer, C.; Damlencourt, J.F.


Book ID
120066916
Publisher
IEEE
Year
2011
Weight
667 KB
Category
Article
ISBN
1457701898

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