[IEEE 2011 21st International Conference on Noise and Fluctuations (ICNF) - Toronto, ON, Canada (2011.06.12-2011.06.16)] 2011 21st International Conference on Noise and Fluctuations - Study of 1/f and generation-recombination noise in four gate transistors

✍ Scribed by Luque Rodriguez, A.; Jimenez Tejada, J. A.; Marun Gonzalez, M.; Reverto Planes, M.; Lopez Varo, P.; Godoy, A.

• Book ID: 111922743
• Publisher: IEEE
• Year: 2011
• Weight: 367 KB
• Volume: 0
• Category: Article
• ISBN: 1457701898
• DOI: 10.1109/icnf.2011.5994322