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[IEEE 2011 18th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2011) - Beirut, Lebanon (2011.12.11-2011.12.14)] 2011 18th IEEE International Conference on Electronics, Circuits, and Systems - CAD tools for fast analysis of parasitic coupling and mismatch effects in switched-capacitor circuits

✍ Scribed by Marechal, Sylvain; Krummenacher, Francois; Kayal, Maher

Book ID: 121086831
Publisher: IEEE
Year: 2011
Weight: 608 KB
Category: Article
ISBN: 1457718448
DOI: 10.1109/ICECS.2011.6122286

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