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[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Impact of total ionizing dose on the electromagnetic susceptibility of a single bipolar transistor

✍ Scribed by Doridant, A.; Jarrix, S.; Raoult, J.; Blain, A.; Chatry, N.; Calvel, P.; Hoffmann, P.; Dusseau, L.

Book ID: 126783402
Publisher: IEEE
Year: 2011
Weight: 532 KB
Category: Article
ISBN: 1457705850
DOI: 10.1109/radecs.2011.6131307

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