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[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Combined use of heavy ion and proton test data in the determination of a GaAs Power MESFET critical charge and sensitive depth

✍ Scribed by Garcia, Ruben; Daly, Eamonn J.; Evans, Hugh D. R.; Nieminen, Petteri; Santin, Giovanni; Sierawski, Brian D.; Mendenhall, Marcus H.

Book ID: 126714694
Publisher: IEEE
Year: 2011
Weight: 449 KB
Category: Article
ISBN: 1457705850
DOI: 10.1109/RADECS.2011.6131402

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