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[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Simulation of Total Ionising Dose on LDMOS devices for High Energy Physics applications

✍ Scribed by Fernandez-Martinez, P.; Palomo, F.R.; Diez, S.; Hidalgo, S.; Ullan, M.; Flores, D.; Sorge, R.

Book ID: 121743533
Publisher: IEEE
Year: 2011
Weight: 688 KB
Category: Article
ISBN: 1457705850
DOI: 10.1109/RADECS.2011.6131412

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