[IEEE 2011 10th International Workshop on Electronics, Control, Measurement and Signals (ECMS) - Liberec, Czech Republic (2011.06.1-2011.06.3)] 2011 10th International Workshop on Electronics, Control, Measurement and Signals - Test pattern compression based on pattern overlapping and broadcasting

✍ Scribed by Chloupek, Martin; Novak, Ondrej

• Book ID: 120234902
• Publisher: IEEE
• Year: 2011
• Weight: 213 KB
• Category: Article
• ISBN: 1612843972
• DOI: 10.1109/IWECMS.2011.5952372