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[IEEE 2010 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Santa Barbara, CA, TBD (2010.08.21-2010.08.21)] 2010 Workshop on Fault Diagnosis and Tolerance in Cryptography - Passive and Active Combined Attacks on AES Combining Fault Attacks and Side Channel Analysis

✍ Scribed by Clavier, Christophe; Feix, Benoit; Gagnerot, Georges; Roussellet, Mylène

Book ID: 120642522
Publisher: IEEE
Year: 2010
Weight: 366 KB
Category: Article
ISBN: 1424478448
DOI: 10.1109/FDTC.2010.17

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