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[IEEE 2010 Third International Conference on Software Testing, Verification and Validation - Paris, France (2010.04.6-2010.04.10)] 2010 Third International Conference on Software Testing, Verification and Validation - Repairing GUI Test Suites Using a Genetic Algorithm

✍ Scribed by Huang, Si; Cohen, Myra B.; Memon, Atif M.

Book ID: 126018407
Publisher: IEEE
Year: 2010
Weight: 473 KB
Category: Article
ISBN: 1424464358
DOI: 10.1109/ICST.2010.39

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