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[IEEE 2010 Third International Conference on Communication Theory, Reliability, and Quality of Service - Athens, TBD, Greece (2010.06.13-2010.06.19)] 2010 Third International Conference on Communication Theory, Reliability, and Quality of Service - Reliability Prediction Method Based on Function and Fault Reasoning for Electronic Products

✍ Scribed by Guangyan, Zhao; Yufeng, Sun; Gang, Zhao; Weiwei, Hu

Book ID: 121327112
Publisher: IEEE
Year: 2010
Weight: 394 KB
Category: Article
ISBN: 1424472733
DOI: 10.1109/CTRQ.2010.17

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