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[IEEE 2010 Symposium on Photonics and Optoelectronics (SOPO 2010) - Chengdu, China (2010.06.19-2010.06.21)] 2010 Symposium on Photonics and Optoelectronics - Scratch Types and Damage Thresholds of Fused Silica

✍ Scribed by Jiang, Yong; Yuan, Xiaodong; Xiang, Xia; Wang, Haijun; Xu, Shizhen; Chen, Meng; Li, Xibin; Zheng, Wanguo; Zu, Xiaotao

Book ID: 125497342
Publisher: IEEE
Year: 2010
Weight: 576 KB
Category: Article
ISBN: 1424449634
DOI: 10.1109/SOPO.2010.5504301

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