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[IEEE 2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics (AOM) - Guangzhou, China (2010.12.3-2010.12.6)] Advances in Optoelectronics and Micro/nano-optics - Fiber length and chromatic dispersion measurement technology using a novel optical frequency domain reflectometry

✍ Scribed by Binhao Wang, ; Guofeng Yan, ; Chunsheng Yan,

Book ID: 120158713
Publisher: IEEE
Year: 2010
Weight: 214 KB
Category: Article
ISBN: 142448393X
DOI: 10.1109/AOM.2010.5713515

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