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[IEEE 2010 International Symposium on Electronic System Design (ISED 2010) - Bhubaneswar (2010.12.20-2010.12.22)] 2010 International Symposium on Electronic System Design - Interconnect and Device Scaling Trends in CMOS VLSI

✍ Scribed by Raol, K

Book ID: 120165384
Publisher: IEEE
Year: 2010
Weight: 83 KB
Category: Article
ISBN: 1424489792
DOI: 10.1109/ISED.2010.66

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