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[IEEE 2010 International Students and Young Scientists Workshop "Photonics And Microsystems" - Szklarska Poreba (2010.06.25-2010.06.27)] 2010 International Students and Young Scientists Workshop "Photonics and Microsystems" - Critical thickness of epitaxial thin films using Finite Element Method

✍ Scribed by Wcislo, T; Dabrowska-Szata, M; Gelczuk, L

Book ID: 120256825
Publisher: IEEE
Year: 2010
Weight: 553 KB
Category: Article
ISBN: 1424483247
DOI: 10.1109/STYSW.2010.5714177

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