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[IEEE 2010 International SoC Design Conference (ISOCC 2010) - Incheon, Korea (South) (2010.11.22-2010.11.23)] 2010 International SoC Design Conference - 3D TCAD based approach for the evaluation of nanoscale devices during ESD failure

✍ Scribed by Shrivastava, Mayank; Gossner, Harald; Baghini, Maryam Shojaei; Rao, V. Ramgopal

No coin nor oath required. For personal study only.

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