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[IEEE 2010 International Semiconductor Conference (CAS 2010) - Sinaia (2010.10.11-2010.10.13)] CAS 2010 Proceedings (International Semiconductor Conference) - Hot spots induced by reverse leakage current flow through the semiconductor-dielectric interface from device PN junction periphery

✍ Scribed by Obreja, V V N; Obreja, A C; Nuttall, K I

Book ID: 115450909
Publisher: IEEE
Year: 2010
Weight: 745 KB
Volume: 0
Category: Article
ISBN: 1424457831
DOI: 10.1109/smicnd.2010.5650566

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