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[IEEE 2010 International Kharkov Symposium on Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW) - Kharkiv, Ukraine (2010.06.21-2010.06.26)] 2010 INTERNATIONAL KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WAVES - Millimeter wave technique for non-destructive Si wafer homogeneity characterization

โœ Scribed by Laurinavicius, A.; Derkach, V.N.; Anbinderis, T.


Book ID
120257549
Publisher
IEEE
Year
2010
Weight
671 KB
Category
Article
ISBN
1424479002

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