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[IEEE 2010 International Forum on Strategic Technology (IFOST) - Ulsan, Korea (South) (2010.10.13-2010.10.15)] International Forum on Strategic Technology 2010 - Fault diagnosis system using LPC coefficients and neural network

✍ Scribed by Hyungseob Han, ; Sangjin Cho, ; Uipil Chong,

Book ID: 126681074
Publisher: IEEE
Year: 2010
Weight: 789 KB
Category: Article
ISBN: 1424490383
DOI: 10.1109/IFOST.2010.5667999

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