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[IEEE 2010 International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Chengdu, China (2010.05.8-2010.05.11)] 2010 International Conference on Microwave and Millimeter Wave Technology - Impact of bias current and geometry on noise performance of SiGe HBT low noise amplifier

✍ Scribed by Xie, Hongyun; Zhang, Wanrong; Shen, Pei; Chen, Liang; Sun, Botao; You, Yunxia

Book ID: 121086185
Publisher: IEEE
Year: 2010
Weight: 109 KB
Category: Article
ISBN: 142445705X
DOI: 10.1109/ICMMT.2010.5525235

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